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Omron EE-SPW321 Photomicrosensor

The Omron EE-SPW321 Photomicrosensor offers Throughbeam type, 300 mm Sensing distance, NPN Output, Pre-wired models, 12 to 24 VDC Power supply voltage, Dark-ON mode. Manufactured by Omron under the Omron Photoelectric Sensors category, this model belongs to the Omron EE Series.

BrandOmron
ProductPhotomicro Sensors
Model NumberEE-SPW321

Omron EE-SPW321 Photomicrosensor – Technical Specifications

SpecificationValue
Sensing MethodThroughbeam type
Sensing Distance300 mm
Power Supply Voltage12 to 24 VDC
Control Output (Output Type)NPN
Connection MethodPre-wired models
Cable Length2 m (Cable length from emitter to amplifier: 0.5 m)
Current ConsumptionAverage value: 30 mA
Operation ModeDark-ON
Response TimeOperate or reset: 1 ms max.
Control Output (Residual Voltage)at 100 mA load current: 1 V max.
Control Output (Load Current)100 mA max.
IndicatorLight indicator (red LEDs on Sensor and Amplifier)
Ambient Temperature (Operating)-20 to 55 ℃
Ambient Humidity (Operating)5 to 85 %
Vibration ResistanceDestruction: 10 to 55 Hz, 1.5 mm double amplitude each in X, Y, and Z directions for 2 h
Shock ResistanceDestruction: 500 m/s2
Degree Of ProtectionIP64
MaterialCase: ABS resin Lens: Acrylic resin

The Omron EE-SPW321 is a compact through-beam photomicrosensor with a built-in amplifier, offering precise object detection up to 300 mm. It comes pre-wired with a 2 m cable and a 0.5 m emitter-to-amplifier connection, making it easy to install in space-constrained setups.

This model operates in Dark-ON mode and features an NPN open collector output, supporting up to 100 mA load current. The integrated red LED indicators on both the sensor and amplifier enable quick status checks. With a fast 1 ms response time and low 30 mA current consumption, it delivers consistent performance in industrial automation tasks.

Built from durable ABS resin and rated IP64, the EE-SPW321 withstands harsh environments, including temperature ranges from -20Β°C to 55Β°C. It’s a reliable choice for applications in packaging, part detection, and machine positioning systems.

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